| 一种简化的模拟电路测试性评价方法 |
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| 引用本文： | 陈晓梅.一种简化的模拟电路测试性评价方法[J].电子产品可靠性与环境试验,2007,25(5):25-29. |
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| 作者姓名： | 陈晓梅 |
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| 作者单位： | 华北电力大学电气电子工程学院,北京,102206 |
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| 摘 要： | 模拟电路的测试性是进行故障诊断和定位的重要依据.采用基于符号化的分析方法来进行测试性评价,相对于数值计算的方法更有优势.提出了一种测试性矩阵的构建方法,同时给出并证明了基于该测试矩阵进行测试性评价的方法.该评价方法的特点是计算简单实用,且消除了计算误差.最后,通过电路实例,验证了该方法的有效性及其实现上的简洁性.
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| 关 键 词： | 测试性评价 符号化分析方法 测试性矩阵 故障诊断和定位 |
| 文章编号： | 1672-5468（2007）05-0025-05 |
| 修稿时间： | 2007-04-24 |
A Simplified Inherited Testability Evaluation Method for Analog Circuit |
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| CHEN Xiao-mei.A Simplified Inherited Testability Evaluation Method for Analog Circuit[J].Electronic Product Reliability and Environmental Testing,2007,25(5):25-29. |
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| Authors: | CHEN Xiao-mei |
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| Institution: | College of Electrical and Electronic Engineering North China Electric Power University, Beijing 102206, China |
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| Abstract: | The testability of the analog circuit is an important basis for its fault diagnosis and location. Testability evaluation based on the symbolic analysis has more advantages than the numerical method. In this paper, a new construction method for testability matrix is put forward together with the testability evaluation method based on it and its proof. This new method is more practical, and its computation is more simple with no computation error. Finally, with a simple circuit instance, the effectiveness and the advantage of the new method is examined and verified. |
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| Keywords: | testability evaluation symbolic analysis testability matrix fault diagnosis and location |
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