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Pressure-Induced Ionic-Electronic Transition in BiVO_4
Authors:Shu-Peng Lyu  Jia Wang  Guo-Zhao Zhang  Yu-Fei Wang  Min Wang  Cai-Long Liu  Chun-Xiao Gao  Yong-Hao Han
Abstract:Electrical transport properties of bismuth vanadate(BiVO_4) are studied under high pressures with electrochemical impedance spectroscopy. A pressure-induced ionic-electronic transition is found in BiVO_4. Below 3.0 GPa, BiVO_4 has ionic conduction behavior. The ionic resistance decreases under high pressures due to the increasing migration rate of O~(2-)ions. Above 3.0 GPa the channels for ion migration are closed. Transport mechanism changes from the ionic to the electronic behavior. First-principles calculations show that bandgap width narrows under high pressures, causing the continuous decrease of electrical resistance of BiVO_4.
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