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偏振X射线荧光系统测量痕量Cd元素的Geant4模拟研究
引用本文:欧阳周璇,马英杰,李豆豆,刘易. 偏振X射线荧光系统测量痕量Cd元素的Geant4模拟研究[J]. 光谱学与光谱分析, 2022, 42(4): 1064-1069. DOI: 10.3964/j.issn.1000-0593(2022)04-1064-06
作者姓名:欧阳周璇  马英杰  李豆豆  刘易
作者单位:成都理工大学,四川 成都 610059
基金项目:国家自然科学基金项目(12075038)资助;
摘    要:通过传统能量色散X射线荧光分析(EDXRF)对Cd元素进行痕量分析时,X光管发出的原级轫致辐射连续谱对Cd元素的分析具有严重的影响.为了减弱原级X射线对测量结果的影响,通过Geant4程序包模拟不同几何尺寸下偏振激发X射线荧光分析(P-EDXRF)中荧光靶的结构,研究其在减弱测量过程中原级X射线轫致辐射连续谱的影响.为...

关 键 词:Geant4  荧光靶  痕量分析  P-EDXRF
收稿时间:2021-03-13

The Research of Polarized Energy Dispersive X-Ray Fluorescence for Measurement Trace Cadmium by Geant4 Simulation
OUYANG Zhou-xuan,MA Ying-jie,LI Dou-dou,LIU Yi. The Research of Polarized Energy Dispersive X-Ray Fluorescence for Measurement Trace Cadmium by Geant4 Simulation[J]. Spectroscopy and Spectral Analysis, 2022, 42(4): 1064-1069. DOI: 10.3964/j.issn.1000-0593(2022)04-1064-06
Authors:OUYANG Zhou-xuan  MA Ying-jie  LI Dou-dou  LIU Yi
Affiliation:Chendu University of Technology, Chendu 610059, China
Abstract:Primary bremsstrahlung spectrum of X-ray tube has serious influence for trace Cadmium analysis in traditional EDXRF. Secondary targets with different geometry sizes were studied by Geant4 code. To enhance the efficiency of Geant4 simulations, the simulation processes were divided into three stages. In the first stage, primary spectra at different tube voltages were acquired using Geant4 code to simulate electrons of different voltages hitting anode target. In the second stage, Te and BaSO4 of different kinds and geometry as secondary target materials, simulated. The simulation results show that when Te, whose Kα1 energy (27.468 keV) closes to the absorption limit of Cd (26.711 keV) is used as the fluorescence target material, the characteristic peak intensity of Te increases rapidly before 100 μm with the increase of target thickness, and tends to be stable after 150 μm. However, the signal to noise ratio (SNR) reaches the maximum value of 21.434 at 80 μm. Due to the self-absorption effect of the secondary target material, SNR declines slightly and becomes stable after reaching the saturation absorption thickness. In different application scenarios, the materials of the secondary target should be various. When there is no limit to the measurement time, the secondary target with greater fluorescence intensity should be selected. But, when the measurement time is relatively short, the secondary target of greater SNR should be selected. In the third stage, output spectra of the secondary target were used to activate sample containing 0.01% cadmium element. The output spectra of the Te element secondary target were used to activate samples, and the peak-to-background ratio of the Kα1 peak of Cd element was 8.28. The primary spectra were used to activate samples, and the peak-to-background ratio is 2.29. Although it has a great increase, the scattering peak of the Te element always influences the Kα1 peak of the Cd element. The BaSO4 was selected as secondary target material because the characteristic X-ray energy is farther away from the Kα1 peak of the Cd element. The decrease of the peak-to-background ratio of target element could be weakened caused by the matrix elements of the sample. The peak-to-background ratio is increased to 14.179. The activation effect can be further improved by increasing the tube voltage of the X-ray tube. The optimal peak-to-background ratio of 21.431 could be obtained at the 70 kV tube voltage.
Keywords:Geant4   Secondary target   Trace analysis   P-EDXRF  
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