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BaF2晶体的取向和入射束的剂量对溅射的影响
引用本文:陶振兰,王震遐,朱福英,章骥平,潘冀生,周祖尧,沈定中,袁湘龙,华素坤. BaF2晶体的取向和入射束的剂量对溅射的影响[J]. 物理学报, 1994, 43(10): 1734-1738
作者姓名:陶振兰  王震遐  朱福英  章骥平  潘冀生  周祖尧  沈定中  袁湘龙  华素坤
作者单位:(1)中国科学院上海硅酸盐研究所; (2)中国科学院上海冶金研究所; (3)中国科学院上海原子核研究所
基金项目:国家自然科学基金资助的课题.
摘    要:27keV Ar离子束沿法向分别入射在BaF2单晶(111),(100)和(110)的晶面上,用捕获器方法和Rutherford背散射分析法测定了Ba原子的溅射角分布和溅射产额。结果发现不同取向的晶体表面,它们的溅射产额有明显差异。当用剂量为5×1017ion/cm2的Ar离子分别轰击这三种晶面时,其溅射产额的顺序Y100>y111>y110.对已被上述剂量辐照过的晶面再作相同剂量轰击时,测得的溅射产额明显增大。这些结果被认为是由于在离子辐照过程中表面晶格受损逐步增大所致。关键词

关 键 词:氟化钡晶体 取向 剂量 溅射
收稿时间:1993-07-12

EFFECT OF CRYSTAL ORIENTATION AND INCIDENT ION FLUENCE ON SPUTTERING FROM ION-IRRADIATED BaF2
TAO ZHEN-LAN,WANG ZHEN-XIA,ZHU FU-YING,ZHANG JI-PING,PAN JI-SHENG,ZHOU ZU-YAO,SHEN DING-ZHONG,YUAN XIANG-LONG and HUA SU-KUN. EFFECT OF CRYSTAL ORIENTATION AND INCIDENT ION FLUENCE ON SPUTTERING FROM ION-IRRADIATED BaF2[J]. Acta Physica Sinica, 1994, 43(10): 1734-1738
Authors:TAO ZHEN-LAN  WANG ZHEN-XIA  ZHU FU-YING  ZHANG JI-PING  PAN JI-SHENG  ZHOU ZU-YAO  SHEN DING-ZHONG  YUAN XIANG-LONG  HUA SU-KUN
Abstract:BaF2 Crystal was irradiated with 27keV Ar ions along the normal of (111), (100) and (110) planes at a current density of 1017μA/cm2. Using collector technique and RBS analysis, the angular distribution and yield of Ba atoms sputtered from BaF2 crystal have been measured as a fuction of orientation and ion fluence. The obtained angular distributions of Ba atoms sputtered are over-cosine type for all specimens. The sputtering yields were strongly dependent on the fluence of the incident beam on the targets
Keywords:
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