Magnetic force microscopy signal of flux line above a semi-infinite type II-superconductor

We have examined a single flux line in the semi-infinite type-II superconductor. The stray magnetic field of the flux line has been calculated. We have found that the vertical force exerted on a magnetic force microscopy (MFM) tip from the flux line is measurable by currently existing MFM. Two types of magnetic tips were taken into consideration, solid and thin film tips. For example, with a Cobalt film of the thickness of 100 nm and 30 nm on a tip, we found a vertical force of 4*10^–10 N and 1.5*10^–10 N, respectively. The lateral force exerted on a tip by the flux line was also calculated. The lateral force must be small enough to prevent the flux line from becoming depinned.