| 氮化硅粉料的漫反射傅里叶变换红外光谱研究 |
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| 引用本文： | 代建清,黄勇,谢志鹏,杨金龙,许兴利.氮化硅粉料的漫反射傅里叶变换红外光谱研究[J].光谱学与光谱分析,2002,22(2):218-222. |
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| 作者姓名： | 代建清 黄勇 谢志鹏 杨金龙 许兴利 |
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| 作者单位： | 清华大学材料科学与工程系,新型陶瓷与精细工艺国家重点实验室,北京,100084 |
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| 基金项目： | 高技术 863计划资助 (863 71 5 0 6 0 1 0 0 )，国家重点基础研究发展规划 (973)课题资助 (G2 0 0 0 0 672 0 4 ) |
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| 摘 要： | 利用漫反傅里叶变换红外（DRIFT）光谱技术，研究了氮化硅粉示纯样品和KBr稀释后样品的漫反射光谱的差别，并利用氮化硅粉末纯样品的DRIFT谱图，研究了四种商业氮化硅粉料初始及锻烧后的表面特征，研究发现，与KBr稀释的样品相比，氮化硅粉末纯样品的漫反射红外光谱在1190cm^-1波数处出现了对应于颗粒表面Si-O振动的尖锐强峰。所研究的四种商业氮化硅原始料漫反射光普有很大的差异，煅烧处理后粉料表面的氨基基因和Si-H消失，Si-O和Si-OH的数量显著增加。
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| 关 键 词： | 氮化硅粉料 漫反射 傅里叶变换 红外光谱 表面基团 陶瓷 表面特征 结构 |
| 文章编号： | 1000-0593(2002)02-0218-05 |
| 修稿时间： | 2000年10月8日 |
Diffuse Reflectance Infrared Fourier Transform Study of Silicon Nitride Powders |
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| DAI Jian qing,HUANG Yong,XIE Zhi peng,YANG Jin long,and XU Xing li State Key Laboratory of New Ceramics and Fine Processing.Diffuse Reflectance Infrared Fourier Transform Study of Silicon Nitride Powders[J].Spectroscopy and Spectral Analysis,2002,22(2):218-222. |
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| Authors: | DAI Jian qing HUANG Yong XIE Zhi peng YANG Jin long and XU Xing li State Key Laboratory of New Ceramics and Fine Processing |
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| Institution: | DAI Jian qing,HUANG Yong,XIE Zhi peng,YANG Jin long,and XU Xing li State Key Laboratory of New Ceramics and Fine Processing,Department of Materials Science and Engineering,Tsinghua University,Beijing 100084,China |
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| Abstract: | With the diffuse reflectance infrared Fourier transform (DRIFT) technique,the spectrum of unmixed Si 3N 4 powder,as well as that of the sample dispersed in KBr,were studied in this paper.Four types of commerical Si 3N 4 powders,surface chemistry of the unmixed samples of as received and calcined were studied by DRIFT.Comparing with the diluted sample,the DRIFT spectra of unmixed sample appear an intensive peak at about 1 190 cm -1 ,which indicates the Si-O bonding on the particle surface.For the calcined powders,the amine structure and Si-H bonding disappeared,while the amount of Si-O and Si-OH increased apparently. |
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| Keywords: | DRIFT Si 3N 4 Surface group |
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