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Laser-induced breakdown spectroscopy: technique,new features,and detection limits of trace elements in Al base alloy
Authors:H Hegazy  E A Abdel-Wahab  F M Abdel-Rahim  S H Allam  A M A Nossair
Institution:1. Physics Department, Faculty of Science, Jazan University, Jazan, 2079, Saudi Arabia
2. Plasma Physics Department, NRC, Atomic Energy Authority, Enshass, 13759, Egypt
3. Physics Department, Faculty of Science, Al-Azhar University, Assiut Branch, Egypt
4. Laboratory of Lasers and New Materials, Department of Physics, Faculty of Science, Cairo University, Cairo, Egypt
Abstract:Laser-induced breakdown spectroscopy (LIBS) has proven to be extremely versatile, providing multielement analysis in real time without sample preparation. The principle is based on the ablation of a small amount of target material by interaction of a strong laser beam with a solid target. The laser must have sufficient energy to excite atoms and to ionize them to produce plasma. We aimed to improve the LIBS limit of detection (LOD) and the precision of spectral lines emitted from the produced plasma by optimizing the parameters affecting the LIBS technique. LIBS LOD is affected by many experimental parameters such as interferences, self-absorption, spectral overlap, signal-to-noise ratio, and matrix effects. The plasma in the present study is generated by focusing a 6-ns pulsed Nd–YAG laser at the fundamental wavelength of 1,064 nm onto the Al target in air at atmospheric pressure. The emission spectra are recorded using an SE 200 Echelle spectrometer manufactured by the Catalina Corporation; it is equipped with an ICCD camera type Andor model iStar DH734-18. This spectrometer allows time-resolved spectral acquisition over the whole UV-NIR (200–1,000 nm) spectral range. Calibration curves for Cu, Mg, Mn, Si, Cr, and Fe were obtained with linear regression coefficients around 99 % on the average in aluminum standard alloy samples. The determined LOD has very useful improvements for Cu I at 521.85 nm, Si I at 288.15 nm, Mn I at 482.34 nm, and Cr I at 520.84 nm spectral lines. LOD is improved by 83.8 % for Cu, 49 % for Si, 84.3 % for Mn, and 45 % for Cr lower with respect to the previous works.
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