A comparative study of the microstructures and optical properties of Cu- and Ag-doped ZnO thin films |
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Authors: | Y Chen GH Zhang SY Ma |
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Institution: | a Key Laboratory for Electronic Materials of the State National Affairs Commission of PRC, Northwest University for Nationality, Lanzhou, Gansu 730030, People's Republic of China b College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou, Gansu 730070, People's Republic of China |
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Abstract: | Cu- and Ag-doped ZnO films were deposited by direct current co-reactive magnetron sputtering technique. The microstructure, the chemical states of the oxygen, zinc, copper and silver and the optical properties in doped ZnO films were investigated by X-ray diffraction spectroscopy (XRD), X-ray photoelectron spectroscopy (XPS) and UV-Visible spectroscopy. XRD analysis revealed that both of Cu- and Ag-doped ZnO films consist of single phase ZnO with zincite structure while the doping elements had an evident effect on the (0 0 2) preferential orientation. The XPS spectra showed that the chemical states of oxygen were different in Cu- and Ag-doped ZnO thin films, which may lead to the shift of the band gap as can be observed in the transmittance and absorption spectra. Meanwhile, the widths of band tails of ZnO films became larger after Cu and Ag doping. |
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Keywords: | 81 05 Dz 61 05 cp 82 80 Pv |
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