Distortion Correction Protocol for Digital Image Correlation after Scanning Electron Microscopy: Emphasis on Long Duration and Ex-Situ Experiments

Recently, scanning electron microscopy (SEM) has been used for digital image correlation (DIC), as micrographs can be acquired with high magnification, providing improved resolution to quantify strain heterogeneities. However, it has been shown by researchers that SEM images can be problematic due to inherent electromagnetic distortions that are not present in optical images. Drift, spatial distortions, and magnification uncertainties are the main issues that can seriously affect the accuracy of localized strain measurements. The present work focuses on long duration experiments, for which images are taken days or weeks apart. We have proposed a systematic procedure to reduce drift, correct spatial distortion, and account for magnification variations between pairs of acquired images. Additionally, SEM parameters are discussed and chosen to increase the signal-to-noise ratio and improve the accuracy of the DIC measurements. The spatial distortion correction increases the repeatability of the correlated values and the precision of the measurements. The implementation for this type of correction is done by applying the measured distortion gradient of a certified grid onto the DIC strain field. The magnification adjustment increases the reliability of the strain maps, ensuring the measurements are in agreement with the actual strain induced during the experiment. We have presented a systematic protocol for ex-situ DIC experiments within the SEM and some basic cross-check procedures that can be performed to evaluate the reliability of the reference grid and the precision of the final strain map.