| Abstract: | Abstract The surfaces of both normal and fluoride treated human dental enamel were examined with x-ray photoelectron spectroscopy (ESCA). Using argon-ion etching to remove thin layers of enamel, subsurface layers were also analyzed. The resulting composition-depth profile showed that stannous fluoride produced a subsurface layer containing both tin and fluoride whereas fluorine was absent from the surface layer. Acid fluoride treatments, however, converted the surface to calcium fluoride which steadily decreased in concentration with depth. |
