| Abstract: | Abstract Background correction in atomic absorption spectrophotometry using a high temperature furnace has a close relation to the chemical treatment and the detection limit. Conventionally used for this correction is the D2 lamp method, but spectral interference is inevitable in this method because the spectral bandwidth of the light from the D2 lamp after passing through a monochromator is as wide as 0.1 to 5 nm. In the analysis of Sb in lead alloy or in steel, there is spectral interference due to high concentration of elements such as Pb, Cu or Fe, in the matrix, so accurate measurement is impossible unless these elements are removed at the pretreatment stage. In polarized analyte Zeeman atomic absorption spectrophotometry developed by the authors, the wavelength of the measuring beam is the same as that of the reference and they are identical in spectral line profile as well as in geometrical shape. They differ only in the direction of polarization. For these reasons, we found that there is no spectral interference like that recognized in the D2 lamp correction technique. As a result, a direct analysis was done simply by dissolving gunmetal or steel in acid without removing the matrix elements Pb, Cu or Fe. |
