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Erbium-doped Si nanocrystals: optical properties and electroluminescent devices
Authors:D Pacifici  A Irrera  G Franz  M Miritello  F Iacona  F Priolo
Institution:a INFM and Dipartimento di Fisica e Astronomia, Corso Italia 57, I-95129, Catania, Italy;b CNR-IMM, Sezione di Catania, Stradale Primosole 50, I-95121, Catania, Italy
Abstract:In the last decade, a strong effort has been devoted towards the achievement of efficient light emission from silicon. Among the different approaches, rare-earth doping and quantum confinement in Si nanostructures have shown great potentialities. In the present work, the synthesis and properties of low-dimensional silicon structures in SiO2 will be analyzed. All of these structures present a strong room temperature optical emission, tunable in the visible by changing the crystal size. Moreover, Si nanocrystals (nc) embedded in SiO2 together with Er ions show a strong coupling with the rare earth. Indeed each Si nc absorbs energy which is then preferentially transferred to the nearby Er ions. The signature of this interaction is the strong increase of the excitation cross section for an Er ion in the presence of Si nc with respect to a pure oxide host. We will show the properties of Er-doped Si nc embedded within Si/SiO2 Fabry–Pérot microcavities. Very narrow, intense and highly directional luminescence peaks can be obtained. Moreover, the electroluminescence (EL) properties of Si nc and Er-doped Si nc in MOS devices are investigated. It is shown that an efficient carrier injection at low voltages and quite intense room temperature EL signals can be achieved, due to the sensitizing action of Si nc for the rare earth. These data will be presented and the impact on future applications discussed.
Keywords:Si nanocrystals  Erbium  Optoelectronics  Devices
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