首页 | 本学科首页   官方微博 | 高级检索  
     


Electric field-induced rearrangement of charged species in metal oxide devices with resistive change: thermodynamic limitations
Authors:I. Kiselev  M. Sommer  V. V. Sysoev
Affiliation:1. Karlsruhe Institute of Technology, Institute of Microstructure Technology, IMT, Hermann-von-Helmholtz-Platz 1, 76344, Eggenstein-Leopoldshafen, Germany
2. Physics Department, Saratov State Technical University, Polytechnicheskaya 77, 410054, Saratov, Russia
Abstract:Hypotheses used to interpret results of electrical measurements on metal oxides which are employed for gas sensors and resistive switching memristors are often based on consideration of drift migration of species (such as oxygen vacancies, chemisorbed ions) under electric field. We offer simple conceptual arguments restricting this approach from the view points of potential minimum principle, ambipolar diffusion and non-equilibrium thermodynamics (Glansdorff-Prigogine criterion).
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号