首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Atomic-scale roughness effect on capillary force in atomic force microscopy
Authors:Jang Joonkyung  Ratner M A  Schatz George C
Institution:School of Nano Science & Technology, Pusan National University, Busan 609-735, South Korea. jkjang@pusan.ac.kr
Abstract:We study the capillary force in atomic force microscopy by using Monte Carlo simulations. Adopting a lattice gas model for water, we simulated water menisci that form between a rough silicon-nitride tip and a mica surface. Unlike its macroscopic counterpart, the water meniscus at the nanoscale gives rise to a capillary force that responds sensitively to the tip roughness. With only a slight change in tip shape, the pull-off force significantly changes its qualitative variation with humidity.
Keywords:
本文献已被 PubMed 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号