|
|||||
|
|
X-ray emission spectra of 3C-SiC studied by tight-binding model including d orbitals |
|
| Authors: | H. Yorikawa |
| Affiliation: | aGraduate School of Engineering, Utsunomiya University, 7-1-2 Yoto, Utsunomiya 321-8585, Japan |
| Abstract: | |
| Keywords: | Silicon carbide Tight-binding method X-ray emission spectroscopy Resonant inelastic X-ray scattering |
| 本文献已被 ScienceDirect 等数据库收录！ | |