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基于模块划分方法的MPEG-2解码芯片可测性设计
引用本文:廖富成,乔飞,周妮,谭斯斯,杨华中.基于模块划分方法的MPEG-2解码芯片可测性设计[J].电视技术,2010,34(11).
作者姓名:廖富成  乔飞  周妮  谭斯斯  杨华中
作者单位:清华信息科学与技术国家实验室清华大学电子工程系;
基金项目:国家自然科学基金,教育部博士点基金(新教师基金),清华大学"结构化集成电路设计"课程研究项目
摘    要:以MPEG-2解码芯片为研究对象,采用基于模块划分方法进行可测性设计,包括边界扫描(JTAG)和内建自测试(BIST).根据MPEG-2系统结构的特点,把模块划分为存储器类型、信号不相关类型和信号相关类型.针对模块特性,设计不同的测试向量生成器,3种类型模块之间并行测试.测试结果表明,与未加入可测试设计的系统比较,固定故障覆盖率由81%提升到95.1%,而硬件开销仅为3%.

关 键 词:MPEG-2  可测性设计  边界扫描测试  内建自测试  故障覆盖率

Testability Design of MPEG-2 Decoder Chip Based on Module Partition
LIAO Fu-cheng,QIAO Fei,ZHOU Ni,TAN Si-si,YANG Hua-zhong.Testability Design of MPEG-2 Decoder Chip Based on Module Partition[J].Tv Engineering,2010,34(11).
Authors:LIAO Fu-cheng  QIAO Fei  ZHOU Ni  TAN Si-si  YANG Hua-zhong
Institution:LIAO Fu-cheng,QIAO Fei,ZHOU Ni,TAN Si-si,YANG Hua-zhong(Tsinghua National Laboratory for Information Science and Technology,Department of Electronic Engineering,Tsinghua University,Beijing 100084,China)
Abstract:A module-based methodology is presented to enhance the testability of the MPEG-2 decoder,with JTAG and Built-In Self-Test(BIST) technology employed.Based on the architecture features of the MPEG-2 decoder,modules are divided into three categories:memory modules,signal-correlated modules and signal-non-correlated modules.Based on the characteristics of modules,different test pattern generators are proposed,and different modules are tested in parallel.The test results show that the presented design can promot...
Keywords:MPEG-2  testability design  JTAG  BIST  fault coverage rate  
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