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XPS and AES analysis of passive films on Fe-25Cr-X (X = Mo,V, Si and Nb) model alloys
Authors:C. Hubschmid  D. Landolt  H. J. Mathieu
Affiliation:Département des Matériaux - LMCH, Ecole Polytechnique Fédérale de Lausanne (EPFL), CH-1015, Lausanne, Switzerland.
Abstract:Corrosion resistance of stainless steel is due to the presence of a thin passive film of typically 1-2 nm thickness. The influence of ternary alloying elements on the composition of passive films on Fe-Cr alloys and their pitting corrosion resistance has been investigated. Iron-chromium alloys were analyzed by XPS and AES with model alloys (Fe-25Cr-X with X = at % Mo, Si, V and Nb) formed in sulphate solution in the presence and absence of chloride ions. All ternary alloying elements increase the pitting potential compared to the corresponding binary alloy. Films formed in chloride containing sulphate solution contain both electrolyte anions. Scanning Auger microscopy reveals that for a two phase system such as Fe-25Cr-11Nb, the dendritic phase is enriched with chromium, while essentially all of the niobium is located in the interdendritic eutectic.
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