|
|||||
|
|
Viscous corrections for the viscous potential flow analysis of magnetohydrodynamic Kelvin-Helmholtz instability with heat and mass transfer |
|
| Authors: | M. K. Awasthi R. Asthana G. S. Agrawal |
| Affiliation: | 1. Dipartimento di Fisica, Universit?? di Firenze, via G.Sansone 1, 50019, Sesto Fiorentino (FI), Italy 2. INFN, Sezione di Firenze, via G.Sansone 1, 50019, Sesto Fiorentino (FI), Italy 3. LPC, IN1P3-CNRS, ENSICAEN et Universit?? de Caen, F-14050, Caen-Cedex, France 4. Institut de Physique Nucl??aire, CNRS/IN2P3, Universit?? Paris-Sud 11, F-91406, Orsay cedex, France 5. INFN and University of Bologna, 40126, Bologna, Italy 10. Departamento de Fisica Aplicada, FCCEE Universidad de Huelva, 21071, Huelva, Spain 6. GANIL, CEA/DSM-CNRS/IN2P3, F-14076, Caen cedex, France 14. ??Horia Hulubei?? National Institute of Physics and Nuclear Engineering, RO-077125, Bucharest, Romania 8. INFN-LNL Legnaro, viale dell??Universit?? 2, 35020, Legnaro (Padova), Italy 13. Conservatoire National des Arts et M??tiers, 75141, Paris Cedex 03, France 11. Heavy Ion Laboratory, University of Warsaw, ul. Pasteura 5a, 02-093, Warsaw, Poland 12. Jagiellonian University, Institute of Nuclear Physics IFJ-PAN, PL-31342, Krak??w, Poland 7. Dipartimento di Scienze Fisiche e Sezione INFN, Universit?? di Napoli Federico II, I-80126, Napoli, Italy |
| Abstract: | A ??E-E telescope exploiting a single silicon chip for both ??E measurement and scintillation light collection has been tested. It is a Si - CsI (Tl) telescope tailored for mass identification of light charged particles and intermediate mass fragments. A procedure based on two different shaping filters allows for extraction of the ??E-E information from the single silicon signal. The quality of the obtained fragment identification is expressed in terms of a figure of merit and compared to that of a standard ??E-E telescope. The presented configuration could be a good candidate for the basic cell of a large solid angle array of ??E-E telescopes, given the reduction in complexity and cost of the front-end electronics. |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ | |