Photoelectron spectroscopy and diffraction of surface nanoscale NbO/Nb(110) structures |
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Authors: | M V Kuznetsov A S Razinkin and E V Shalaeva |
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Institution: | (1) Institute of Solid State Chemistry, Ural Division, Russian Academy of Sciences, Ekaterinburg, Russia |
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Abstract: | X-ray photoelectron spectroscopy and diffraction (XPS and XPD) are applied to analyze oxygen-induced surface structures on
the Nb(110) face formed due to oxygen segregation from the crystal bulk on thermal annealing to 2000 K in vacuum and/or oxygen
adsorption in situ at temperatures above 1100 K. The Nb3d, O1s electronic states and valence band spectra of the NbO
x
/Nb(110) surface are studied by XPS, and the results are compared with data for NbO, NbO2, and Nb2O5 oxides. It is shown that niobium atoms entering the composition of surface oxide structures on Nb(110), from the standpoint
of the nearest environment and chemical bond, are similar to metal states in NbO. The NbO
x
layer thickness is estimated to be 0.5 nm. Two chemically inequivalent oxygen states are distinguished on Nb(110), which
are, presumably, atomic chemisorbed oxygen on the parts of the clean surface of the Nb monolayer with hexagonal packing and
oxygen in the composition of NbO
x
-like linear clusters on Nb(110). A model of the NbO
x
/Nb(110) surface takes into account a distortion of the structure of NbO
x
clusters: a periodic vertical shift of metal atoms in Nb-chains and changes in Nb-O bond angles.
Original Russian Text Copyright ? 2009 by M. V. Kuznetsov, A. S. Razinkin, and E. V. Shalaeva
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Translated from Zhurnal Strukturnoi Khimii, Vol. 50, No. 3, pp. 536–543, May–June, 2009. |
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Keywords: | XPS XPD STM surface niobium niobium oxide surface structures |
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