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磁控溅射制备的W,WSi2,Si单层膜和W/Si,WSi2/Si多层膜应力
引用本文:黄秋实,李浩川,朱京涛,王晓强,蒋励,王占山,唐永建. 磁控溅射制备的W,WSi2,Si单层膜和W/Si,WSi2/Si多层膜应力[J]. 强激光与粒子束, 2011, 23(6): 1659-1662. DOI: 10.3788/HPLPB20112306.1659
作者姓名:黄秋实  李浩川  朱京涛  王晓强  蒋励  王占山  唐永建
作者单位:1. 同济大学 物理系, 精密光学工程技术研究所, 上海 200092; 2. 上海市特殊人工微结构材料与技术重点实验室, 上海 200092; 3. 中国工程物理研究院 激光聚变研究中心, 四川 绵阳 621900
基金项目:国家自然科学基金,科技部国际交流与合作专项项目
摘    要:采用直流磁控溅射技术制备了厚度约100 nm的W,WSi2,Si单层膜和周期约为20 nm,Si膜层厚度与周期的比值为0.5的W/Si,WSi2/Si周期多层膜.利用台阶仪对镀膜前后基底表面的面形进行了测试,计算并比较了不同膜系的应力值.结果表明:W单层膜表现出较大的压应力,而W/Si周期膜则表现为张应力.WSi2单层...

关 键 词:应力  形变  多层膜  磁控溅射  X射线
收稿时间:1900-01-01;

Stress analysis of W, WSi2, Si single layers and W/Si, WSi2/Si multilayers fabricated by magnetron sputtering
Huang Qiush,Li Haochuan,Zhu Jingtao,Wang Xiaoqiang,Jiang Li,Wang Zhanshan,Tang Yongjian. Stress analysis of W, WSi2, Si single layers and W/Si, WSi2/Si multilayers fabricated by magnetron sputtering[J]. High Power Laser and Particle Beams, 2011, 23(6): 1659-1662. DOI: 10.3788/HPLPB20112306.1659
Authors:Huang Qiush  Li Haochuan  Zhu Jingtao  Wang Xiaoqiang  Jiang Li  Wang Zhanshan  Tang Yongjian
Affiliation:(1. Institute of Precision Optical Engineering, Department of Physics, Tongji University, Shanghai 200092, China; . Shanghai Key Laboratory of Special Artificial Microstructure Materials and Technology, Tongji University, Shanghai 200092, China; . Research Center of Laser Fusion, CAEP, P. O. Box 919-987, Mianyang 621900, China)
Abstract:A series of W, WSi2, Si thin films and W/Si, WSi2/Si periodic multilayers were fabricated by using DC magnetron sputtering technology. Surface profiles before and after deposition were measured with a stylus profiler and the stresses were calculated. The results indicate that W thin films show relatively large compressive stress, while W/Si multilayers show tensile stress. Both WSi2 thin films and WSi2/Si periodic multilayers show compressive stress. WSi2/Si periodic multilayers have the most stable stress state with no sharp change, and is a good material combination for X-ray multilayer optics with a large number of bilayers.
Keywords:deformation  multilayer  magnetron sputtering  X-ray
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