Probing structural changes of spin-coated polystyrene film after swelling and precipitation by synchrotron GIUSAXS and AFM |
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Authors: | Binbin Sun Yuqing Lai Yoong Kim Yongfeng Men |
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Institution: | (1) School of Polymer Textile and Fiber Engineering, Georgia Institute of technology, Atlanta, GA 30332-0295, USA; |
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Abstract: | Polystyrene film of about 50 nm in thickness on silicon wafer was obtained by spin-coating in tetrahydrofuran solution. The
film exhibits a rough surface as shown by atomic force microscopy images and ellipsometry data. Furthermore, such surface
roughness produced a characteristic lateral correlation peak in an “out-ofplane” scan in the synchrotron grazing incidence
ultra-small angle X-ray scattering pattern. The film was treated with liquids of solvent and non-solvent sequentially, resulting
in a process of swelling and precipitation of the polystyrene film. Such a solvent/non-solvent treatment completely changed
the original surface structure of the film. Aggregates of polystyrene of different sizes were observed both in atomic force
microscopy and synchrotron grazing incidence ultra-small angle X-ray scattering measurements. The results demonstrate that
synchrotron grazing incidence ultra-small angle X-ray scattering is a unique means to investigate large area micro-structural
features of thin films supported on smooth surfaces. |
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