Applications of small-angle X-ray scattering/small-angle neutron scattering and cryogenic transmission electron microscopy to understand self-assembly of surfactants

The self-assembling structures and dynamics of surfactants determine most of their macroscopic physicochemical properties and performances. Herein, we review recent work on the self-assembly of surfactants by small-angle X-ray scattering (SAXS) and small-angle neutron scattering (SANS) in conjunction with cryogenic transmission electron microscopy (Cryo-TEM) from the perspective of researchers having only limited theoretical knowledge of these techniques but expert in surfactants. Emphasis is placed on the structural analysis of typical surfactant aggregates over a wide range of size scales from nanometers up to microns, including spherical and rod-like micelles, wormlike micelles, vesicles, liquid crystals and coacervates, by combining different numerical approaches to the treatment of small-angle scattering data with the direct Cryo-TEM imaging method. Furthermore, the complementarity between SAXS and SANS, and between the scattering techniques and Cryo-TEM, that is, specific contributions of these techniques, is also covered.