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Near-surface stresses in silicon(0 0 1)
Authors:TJ Delph
Institution:Department of Mechanical Engineering and Mechanics, Lehigh University, 19 Memorial Drive West, Bethlehem, PA 18015-3085, USA
Abstract:We report here on a detailed atomistic stress analysis of the near-surface stresses on the 2 × 1 surface reconstruction on Si(0 0 1). We find that the surface stresses are spatially periodic with fairly large amplitude. We additionally investigate the stresses in the neighborhood of an SA-type step.
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