| 含ZnO样本集晶格匹配和热匹配的模式识别分析 |
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| 引用本文： | 张兆春,崔得良,黄柏标,蒋民华.含ZnO样本集晶格匹配和热匹配的模式识别分析[J].化学物理学报(中文版),2000,13(5):562-566. |
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| 作者姓名： | 张兆春 崔得良 黄柏标 蒋民华 |
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| 作者单位： | 山东大学晶体材料研究所, 济南 250100
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| 摘 要： | 利用动态聚类分析、最小生成树、主成分分析等模式识别方法，对含ZnO半导体材料的样本集中各样本之间在300 K时的晶格匹配与热匹配程度进行了分析。结果表明：在300 K时，三种Ⅲ-Ⅴ族氮化物AlN、GaN、InN与ZnO材料之间的晶格匹配和热匹配程度最好。由最小生成树以及主成分二维映射结果可知两类样本分区明显，分类效果良好，表明利用模式识别方法可对含ZnO样本集中各样本之间的晶格匹配和热匹配程度进行识别。
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| 关 键 词： | 晶格匹配 热匹配 模式识别 |
Pattern Recognition Analysis of Lattice-match and Thermo-match for Sample Collection Containing ZnO Semiconductor Material |
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| Zhang Zhaochun,Cui Deliang,Huang Baibiao,Jiang Minhua.Pattern Recognition Analysis of Lattice-match and Thermo-match for Sample Collection Containing ZnO Semiconductor Material[J].化学物理学报(中文版),2000,13(5):562-566. |
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| Authors: | Zhang Zhaochun Cui Deliang Huang Baibiao Jiang Minhua |
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| Abstract: | Some pattern recognition methods including dynamic clustering analysis, minimal spanning tree and principal component analysis have been used to recognize the extents of both lattice-match and thermo-matchat300KforthesamplescontainingZnOsemiconductormaterial. Fromthepatternrecognitionanal-ysis, it is concluded that there exists a lower lattice and thermal misfitsbetween ZnOand threeⅢ-Ⅴgroup nitrides. The results alsoshow that pattern recognition analysisseems to be asuitable tool toselect substrate or bufferlayerforepitaxygrowth, aswellastodesignoptoelectronicdevicesofblueandvioletlightsemicon-ductor materials, such as ZnO and GaN. |
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| Keywords: | ZnO |
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