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Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns |
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| Authors: | RR Rosa MPMA Baroni A Ferreira da Silva J Pontes |
| Institution: | a Núcleo para Simulação e Análise de Sistemas Complexos, Laboratório Associado de Computação e Matemática Aplicada (LAC), Instituto Nacional de Pesquisas Espaciais (INPE), S.J. dos Campos, SP, Brazil b Instituto de Física, Instituto Tecnológico de Aeronáutica (ITA), S.J. dos Campos, SP, Brazil c Instituto de Física, Universidade Federal da Bahia, Salvador, BA, Brazil d Departamento de Física, Universidade Federal do Paraná, Curitiba, PR, Brazil e COPPE, Universidade Federal do Rio de Janeiro, Rio de Janeiro, RJ, Brazil f IP&D, Universidade do Vale do Paraíba (UNIVAP), S.J. dos Campos, SP, Brazil |
| Abstract: | This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales. |
| Keywords: | Disordered surfaces Structural complexity Gradient pattern analysis Wavelet multiresolution analysis Euler characteristic KPZ equation Porous silicon |
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