Characterization of the superficial region of solids using the Rutherford backscattering method with charged particles |
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| Authors: | P. Hsiung P. Trocellier |
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| Affiliation: | 1. Centre d'Etudes Nucléaires de Saclay, 91191, Gif-sur-Yvette Cedex, France
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| Abstract: | In the first part of this work, we show the basic principle of the Rutherford backscattering method and follow the possibilities and performance allowed. We also discuss how to choose the best experimental configuration to provide most significant spectrum in the case of glass surface analysis. |
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