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Local and surface analysis within an analytical electron microscope |
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| Authors: | Pierre Trebbia Daniel Ugarte |
| Institution: | (1) Laboratoire de Physique des Solides, Bâtiment 510, F-91405 Orsay Cedex, France;(2) Institut de Physique Expérimentale, Ecole Polytechnique Fédérale de Lausanne, PHB-Ecublens, CH-1015 Lausanne, Suisse;(3) Present address: Université de Reims, L.A.S.S.I. U.F.R. Sciences, B. P. 347, F-51062 Reims Cedex, France |
| Abstract: | Analytical transmission electron microscopes have the ability to display at very high spatial resolution both the structural information of solid specimens prepared as thin films and the spectroscopic information related either to electronic properties or to the elemental composition. An example of study, by electron energy loss spectroscopy, of small spherical silicon particles is given as an illustration of the performances of the technique. |
| Keywords: | analytical electron microscopy electron energy loss spectroscopy surface plasmon silicon spheres |
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