X-ray photoelectron analysis of lead-silicate glass structure

Characteristics of the atomic structure of lead-silicate glasses, among them the concentration of lead structural forms, the statistics of both silicon-oxygen and lead-oxygen structures of medium-range ordering, and the bonding degrees of silicon-oxygen and lead-oxygen structures, have been found using x-ray photoelectron spectroscopy and thermodynamic simulation. Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 76, No. 2, pp. 209–217, March–April, 2009.