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Characterization of p-n junctions and surface-states on silicon devices by photoemission electron microscopy |
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| Authors: | M. Giesen R.J. Phaneuf E.D. Williams T.L. Einstein H. Ibach |
| Affiliation: | Physics Department, University of Maryland, College Park, MD 20742-4111, USA (E-mail: m.giesen@fz-juelich.de), US Institut für Grenzfl?chenforschung und Vakuumphysik, Forschungszentrum Jülich, D 52425 Jülich, Germany, DE |
| Abstract: | Received: 22 November 1996/Accepted: 17 December 1996 |
| Keywords: | PACS: 85.30 73.20 79.60 |
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