首页 | 本学科首页   官方微博 | 高级检索  
     检索      

激光辐照非制冷微测辐射热计的理论研究
引用本文:周冰,贺宣,刘贺雄,李秉璇,张炎.激光辐照非制冷微测辐射热计的理论研究[J].激光技术,2020,44(4):411-417.
作者姓名:周冰  贺宣  刘贺雄  李秉璇  张炎
作者单位:陆军工程大学石家庄校区 电子与光学工程系,石家庄 050003
摘    要:为了研究非制冷微测辐射热计的激光损伤阈值,根据非制冷微测辐射热计的构造和成像原理,分析了像元温度响应机制,推导出了零偏置下和单次偏置时间内像元受到激光辐照的温度增量计算公式;建立了激光辐照非制冷微测辐射热计的有限元分析模型,结合实际工作条件加载热源载荷进行仿真,模拟了激光造成软损伤的过程。结果表明,激光软损伤阈值可按照零偏置条件下像元温度响应的公式近似计算,其对应的温度偏差不大于3%。该研究为激光压制干扰红外成像系统的损伤阈值计算提供了参考。

关 键 词:光学器件  损伤阈值  有限元仿真  温度响应
收稿时间:2019-09-20

Research on laser irradiation uncooled microbolometer based on finite element analysis
ZHOU Bing,HE Xuan,LIU Hexiong,LI Bingxuan,ZHANG Yan.Research on laser irradiation uncooled microbolometer based on finite element analysis[J].Laser Technology,2020,44(4):411-417.
Authors:ZHOU Bing  HE Xuan  LIU Hexiong  LI Bingxuan  ZHANG Yan
Institution:(Department of Opto-Electronics Engineering, Army Engineering University, Shijiazhuang 050003, China)
Abstract:In order to study the laser damage threshold of an uncooled microbolometer, according to the construction and imaging principle of uncooled microbolometer, the temperature response mechanism of the pixel was analyzed, and the formula for calculating the temperature increment of the laser under the zero offset and single offset time was derived. A finite element analysis model of laser irradiated uncooled microbolometer was established. Simulation was carried out by loading the heat source load in combination with actual working conditions. Then the process of soft damage caused by laser was simulated. The conclusion was drawn: laser soft damage threshold approximate calculation of the pixel temperature response under zero bias conditions can be used to meet 3% accuracy. This study provides a reference for the calculation of damage threshold for laser suppression interference infrared imaging systems.
Keywords:optical devices  damage threshold  finite element simulation  temperature response
本文献已被 维普 万方数据 等数据库收录!
点击此处可从《激光技术》浏览原始摘要信息
点击此处可从《激光技术》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号