Comparison of 2D S-Transform Profilometry and 2D Windowed Fourier Transform Profilometry

Both two-dimensional (2D) Windowed Fourier Transform and 2D S Transform are popular time–frequency analysis tools for processing signals. But fewer articles reported the application of 2D S Transform in Fringe pattern analysis. This paper studies the 2D S Transform and compares it with 2D Windowed Fourier Transform. The phase calculation formula based on the 2D Windowed Fourier Transform “ridge” coefficients and 2D S Transform “ridge” coefficients are deduced respectively. A comparison between them is carried out to show their own characteristic in fringe patterns analysis based on the structured-light illumination. It verifies that the 3D reconstruction result of 2D ST is better than that of 2D WFT because of the employment of the adjusted windows by frequency parameters.