首页 | 本学科首页   官方微博 | 高级检索  
     检索      

原子力显微技术研究ZnO纳米棒的压电放电特性
引用本文:邵铮铮,王晓峰,张学骜,常胜利.原子力显微技术研究ZnO纳米棒的压电放电特性[J].物理学报,2010,59(1):550-554.
作者姓名:邵铮铮  王晓峰  张学骜  常胜利
作者单位:国防科技大学理学院物质与材料科学实验中心,长沙 410073
基金项目:国家高技术研究发展计划(863计划)项目(批准号:2009AA01Z114)资助的课题.
摘    要:在原子力显微镜的接触扫描模式下,研究了半导体ZnO纳米棒的压电放电特性.采用两步湿化学法制备沿c轴择优生长的ZnO纳米棒阵列;利用镀Pt探针接触扫描ZnO纳米棒获得峰值达120 pA电流脉冲,脉冲持续时间可达30 ms,电流脉冲与纳米棒的形貌存在对应关系.镀Pt探针与ZnO纳米棒接触形成肖特基二极管,I-V特性研究表明放电的ZnO纳米棒压电电势必须大于03 V,以驱动肖特基二极管并输出电流;放电时肖特基二极管的结电阻达吉欧(GΩ)量级,是影响压电电势输出的主要因 关键词: ZnO 纳米棒 压电放电 肖特基接触

关 键 词:ZnO  纳米棒  压电放电  肖特基接触
收稿时间:2009-03-22

Piezoelectric discharge characteristic of ZnO nanorod studied with atomic force microscopy
Shao Zheng-Zheng,Wang Xiao-Feng,Zhang Xue-Ao,Chang Sheng-Li.Piezoelectric discharge characteristic of ZnO nanorod studied with atomic force microscopy[J].Acta Physica Sinica,2010,59(1):550-554.
Authors:Shao Zheng-Zheng  Wang Xiao-Feng  Zhang Xue-Ao  Chang Sheng-Li
Abstract:Piezoelectric discharge characteristic of semiconductor ZnO nanorod was studied with atomic force microscope in contact mode. The c-axial orientation ZnO nanorod array film was fabricated with two-step wet-chemical method. Electric pulses were got when Pt coated probe contact-scans the ZnO nanorod, their peak value reaches 120 pA. The electric pulse is related with the topography of ZnO nanorod and has a time duration of 30 ms. The contact of Pt coated probe and ZnO nanorod behaves as a Schottky diode. The I-V curve showed the piezoelectric voltage must be larger than 0.3 V to drive Schottky diode. The resistance of Schottky contact has a magnitude of GΩ order during piezoelectric discharge, which is the major factor impacting the output of piezoelectric potential.
Keywords:ZnO  nanorod  piezoelectric discharge  Schottky contact
本文献已被 CNKI 万方数据 等数据库收录!
点击此处可从《物理学报》浏览原始摘要信息
点击此处可从《物理学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号