Trace and surface analysis of ceramic layers of solid oxide fuel cells by mass spectrometry |
| |
Authors: | J. S. Becker U. Breuer J. Westheide A. I. Saprykin H. Holzbrecher H. Nickel H.-J. Dietze |
| |
Affiliation: | (1) Zentralabteilung für Chemische Analysen, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany;(2) Institut für Werkstoffe und Energietechnik, Forschungszentrum Jülich GmbH, D-52425 Jülich, Germany |
| |
Abstract: | For the trace analysis of impurities in thick ceramic layers of a solid oxide fuel cell (SOFC) sensitive solid-state mass spectrometric methods, such as laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) and radiofrequency glow discharge mass spectrometry (rf-GDMS) have been developed and used. In order to quantify the analytical results of LA-ICP-MS, the relative sensitivity coefficients of elements in a La0.6Sr0.35MnO3 matrix have been determined using synthetic standards. Secondary ion mass spectrometry (SIMS) – as a surface analytical method – has been used to characterize the element distribution and diffusion profiles of matrix elements on the interface of a perovskite/Y-stabilized ZrO2 layer. The application of different mass spectrometric methods for process control in the preparation of ceramic layers for the SOFC is described. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|