Abstract: | The IR reflection spectra are investigated for the systems “thin film of PbWO4 or Bi2WO6-molten quartz v-SiO2 substrate” within the region of 400–1600 cm−1 at T=295 K. Interference in the thin films is considered. Interpretation of the bands belonging to the PbWO4 and Bi2WO6 films is carried out.
I. Franko L’vov State University, 50, Dragomanova St., 290005, L’vov, Ukraine. Translated from Zhurnal Prikladnoi Spektroskopii,
Vol. 65, No. 3, pp. 459–461, May–June, 1998. |