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Über eine optische Methode zum qualitativen und quantitativen Nachweis von Oberflächenfehlern
Authors:R. Baehr  H. Seyfarth
Abstract:The principle of the optic edge method is used for qualitative and quantitative judgment of polished single crystal disks. With the help of simple reflections hints at the nature of mistakes and estimation of the vertical intervals, respectively, can be ascertained. For the application of this procedure into the supervision of production conditions for a constructive solution are reported allowing a simple testing of polished surfaces.
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