Radiation analytical material characterization of diamond layers deposited onto tungsten carbide |
| |
| Authors: | Hans-Jürgen Ullrich Matthias Schlaubitz Roland Haubner Benno Lux |
| |
| Affiliation: | (1) Institute for Materials Science, Dresden University of Technology, Mommsenstrasse 13, D-O-8027 Dresden, Federal Republic of Germany;(2) Institute for Chemical Technology of Anorganic Substances, Vienna University of Technology, Getreidemarkt 9, A-1060 Vienna, Austria |
| |
| Abstract: | The characterization of diamonds deposited onto WC single crystals by means of the CVD-method is reported. Investigations were performed by scanning electron microscopy, X-ray diffraction methods and the Kossel reflection technique. Single diamond crystals were deposited in the form of icosahedrons. An orientation correlation between substrate single crystal and diamond crystals could not be proved. In the paper presented, reasons will be given for this fact. |
| |
| Keywords: | scanning electron microscopy X-ray diffraction Kossel reflection technique epitaxy |
| 本文献已被 SpringerLink 等数据库收录！ |
