| 高纯金属的快速分析-强激光溅射电离飞行时间质谱法 |
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| 引用本文： | 冀家越,杭乐,徐周毅,马思媛,杭纬,黄本立.高纯金属的快速分析-强激光溅射电离飞行时间质谱法[J].中国无机分析化学,2022,12(4):109-114. |
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| 作者姓名： | 冀家越 杭乐 徐周毅 马思媛 杭纬 黄本立 |
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| 作者单位： | 厦门大学,厦门大学,厦门大学,厦门大学,厦门大学,厦门大学 |
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| 基金项目： | 国家重大科研仪器研制项目(22027808)；基金委面上项目(21974116)；基金委青年科学(22004104) |
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| 摘 要： | 随着现代材料行业的发展，高纯金属纯度分析日趋重要。本研究建立了一种基于强激光溅射电离飞行时间质谱（LAI-TOFMS）检测高纯金属纯度新方法。为消除高价离子和多原子离子等干扰峰的影响，在离子源内引入了氦气。通过分析高纯阴极铜的系列标准样品，建立了其中16种痕量元素的固体直接定量分析方法，在4个动态范围内（10-7 – 10-3 μg/g）的线性相关度优于0.97，检出限低至0.1 μg/g。该方法几乎无需样品处理、分析时间短、操作简便、灵敏度高、谱峰干扰小，可用于高纯金属材料纯度及其痕量杂质的快速分析。
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| 关 键 词： | 高纯金属 痕量元素 激光溅射电离 飞行时间质谱 固体样品直接分析 |
| 收稿时间： | 2022/5/25 0:00:00 |
| 修稿时间： | 2022/5/25 0:00:00 |
Rapid Analysis of High Purity Metal - High Irradiance Laser Ablation and Ionization Time-of-flight Mass Spectrometry |
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| JI Jiayue,HANG Le,XU Zhouyi,MA Siyuan,HANG Wei and HUANG Benli.Rapid Analysis of High Purity Metal - High Irradiance Laser Ablation and Ionization Time-of-flight Mass Spectrometry[J].Chinese Journal of Inorganic Analytical Chemistry,2022,12(4):109-114. |
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| Authors: | JI Jiayue HANG Le XU Zhouyi MA Siyuan HANG Wei and HUANG Benli |
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| Institution: | Department of Chemistry,MOE Key Lab of Spectrochemical Analysis Instrumentation,College of Chemistry and Chemical Engineering,Xiamen University,Department of Chemistry,MOE Key Lab of Spectrochemical Analysis Instrumentation,College of Chemistry and Chemical Engineering,Xiamen University,Department of Chemistry,MOE Key Lab of Spectrochemical Analysis Instrumentation,College of Chemistry and Chemical Engineering,Xiamen University,Department of Chemistry,MOE Key Lab of Spectrochemical Analysis Instrumentation,College of Chemistry and Chemical Engineering,Xiamen University,Department of Chemistry,MOE Key Lab of Spectrochemical Analysis Instrumentation,College of Chemistry and Chemical Engineering,Xiamen University,Department of Chemistry,MOE Key Lab of Spectrochemical Analysis Instrumentation,College of Chemistry and Chemical Engineering,Xiamen University |
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| Abstract: | |
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| Keywords: | High purity metals Trace element Laser ablation and ionization Time-of-flight mass spectrometry Direct solids analysis |
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