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X-Ray photoelectron spectroscopy investigations of atomic interactions in surface layers of multilayered nanostructures (Co45Fe45Zr10/a-Si)40 and (Co45Fe45Zr10/SiO2)32 |
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| Authors: | E. P. Domashevskaya A. V. Chernyshev S. Yu. Turishchev Yu. E. Kalinin A. V. Sitnikov D. E. Marchenko |
| Affiliation: | 1. Voronezh State University, Universitetskaya pl. 1, Voronezh, 394006, Russia 2. Voronezh State Technical University, Moskovskii pr. 14, Voronezh, 394026, Russia 3. Physikalische und Theoretische Chemie, Freie Universit?t Berlin, Takustraβe 3, Berlin, D-14195, Germany |
| Abstract: | The interatomic interaction and chemical state of elements in amorphous multilayered (Co45Fe45Zr10/a-Si)40 and (Co45Fe45Zr10/SiO2)32 nanostructures with different interlayers have been investigated by X-ray photoelectron spectroscopy using synchrotron radiation. The results of X-ray photoelectron spectroscopy investigations have demonstrated that, in surface layers of all the studied multilayered structures, the metallic layer components Co, Fe, and Zr are in the oxidized state. The silicon state is found to be identical and close to the state of nonstoichiometric silicon oxide, regardless of the presumed compositions of SiO2 and a-Si interlayers. After the removal of surface layers of the multilayered structures in the sample preparation chamber by ion etching, the metallic layer components Co, Fe, and Zr are predominantly in the elemental state. |
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