Thermal effect on microstructure vibration of SiO2 thin films |
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| Institution: | 1. Tianjin Key Laboratory of Optical Thin Film, Tianjin Jinhang Technical Physics Institute, Tianjin, 300308, China;2. Shenzhen Aerospace Industrial Technology Academy, Shenzhen, 518048, China;1. Hebei Provincial Key Laboratory of Inorganic Nonmetallic Materials, College of Materials Science and Engineering, North China University of Science and Technology, Tangshan 063009, China;2. School of Materials Science and Engineering, Tongji University, Shanghai 200092, China;3. School of Pharmacy, North China University of Science and Technology, Tangshan 063009, China;1. Key Laboratory of Extraordinary Bond Engineering and Advanced Materials Technology (EBEAM), Yangtze Normal University, Chongqing 408100, China;2. School of Materials Science and Engineering, Xiangtan University, Xiangtan 411105, China;3. Institute for Coordination Bond Engineering, China Jiliang University, Hangzhou 310018, China;4. Institute of Nanosurface Science and Engineering, Shenzhen University, Shenzhen 518060, China;5. NOVITAS, Nanyang Technological University, 639798, Singapore;1. Department of Biological Chemistry, Regional University of Cariri, Crato, CE, 63105-000, Brazil;2. Department of Physics, Federal University of Ceará, Fortaleza, CE, 60455-760, Brazil;3. Science and Technology Centre – Course of Physics, State University of Ceará, Quixadá, CE, 62040-370, Brazil;4. Institute of Physics, Federal University of Mato Grosso, Cuiabá, MT, 78060-900, Brazil |
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| Abstract: | The microstructure of amorphous SiO2 thin film is a random network structure in which a large amount of SiO4] is interconnected with a specific Si OSi bond angle. The SiO2 thin films used in this paper were prepared by ion beam sputtering and electron beam evaporation deposition techniques. Two-dimensional correlation spectroscopy analysis techniques were used in this study. By measuring the infrared temperature spectrum, we obtained the two-dimensional correlation synchronous spectrum and asynchronous spectrum, and decomposed the in-phase and out-phase asymmetric stretching vibration characteristics of SiOSi. As the temperature increases, the spectral transmittance of the vibrating peak decreases, and the relative change of in-phase asymmetric stretching vibration absorption peak is higher than that of the out-phase asymmetric stretching vibration absorption peak. |
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| Keywords: | Thin film Two-Dimensional correlation spectroscopy Vibration characteristics |
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