High spectral resolution analysis of tunable narrowband resonant grating waveguide structures |
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Authors: | M.A. Bader A. Selle O. Stenzel R. Delmdahl G. Spiecker C. Fischer |
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Affiliation: | 1. Laser-Laboratorium G?ttingen e.V., Hans-Adolf-Krebs-Weg 1, 37077, G?ttingen, Germany 2. Fraunhofer IOF, Albert-Einstein-Str. 7, 07745, Jena, Germany 3. Coherent GmbH, Hans-B?ckler-Str. 12, 37079, G?ttingen, Germany 4. Metrolux GmbH, Bertha-von-Suttner-Str. 5, 37085, G?ttingen, Germany
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Abstract: | A high spectral resolution analysis of narrowband reflection filters based on resonant grating waveguide structures is presented. A tunable high-performance dye laser with ∼ 0.15 cm-1 line width and a beam analyzing system consisting of three simultaneously controlled CCD cameras were used to investigate grating waveguide resonances at wavelengths in the 694 nm and 633 nm ranges. A reflectivity of ∼ 91% and a line width of ∼ 0.55 nm were measured and theoretically modeled for a resonant reflection filter specifically designed for the ruby laser wavelength 694.2 nm. For a second grating waveguide structure, designed for the helium-neon laser emission wavelength 632.8 nm, we observed a thermal shift of its spectral resonance position of several nanometers, when increasing the sample temperature by some degrees. An inverse thermal shift was observed when the structure was subsequently cooled down to room temperature. Our results suggest implementation of grating waveguide devices combining a narrow line width with a tunability of the resonant response into innovative concepts for reflection filter and sensor applications. PACS 42.62.-b; 42.79.Dj; 42.79.Gn |
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