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基于样本块匹配的干涉图延拓方法
引用本文:黄菁,朱日宏,陈磊. 基于样本块匹配的干涉图延拓方法[J]. 光学学报, 2007, 27(7): 217-1223
作者姓名:黄菁  朱日宏  陈磊
作者单位:南京理工大学电子工程与光电技术学院,南京,210094;南京理工大学电子工程与光电技术学院,南京,210094;南京理工大学电子工程与光电技术学院,南京,210094
基金项目:江苏省现代光学技术重点实验室开放课题(T8108030)资助课题
摘    要:在快速傅里叶变换(FFT)方法处理单幅干涉图原理的基础上,提出一种基于样本块匹配的干涉图延拓方法,利用干涉图像的可信度和等照度线特征,来确定待填充块的优先权,然后在干涉图的已知区域寻找与待填充块最相似的样本块来进行填充。充分利用了干涉图的条纹特征,结合梯度变化方向有效地合成纹理信息,具有很好的延拓效果。最后将该干涉图延拓方法与傅里叶变换,合适的滤波函数和相位解包方法结合起来形成整套单幅干涉图处理方法。采用该单幅干涉图处理方法获得的波面峰谷值与Zygo移相干涉仪得到的平均相差不到λ/100,并且两种方法获得的波面均方根值平均相差不到λ/200。

关 键 词:光学测量  干涉图延拓  样本块匹配  快速傅里叶变换法
文章编号:0253-2239(2007)07-1217-7
收稿时间:2006-10-10
修稿时间:2006-10-10

Interferogram Spreading Method Based on Exemplar Matching
Huang Jing,Zhu Rihong,Chen Lei. Interferogram Spreading Method Based on Exemplar Matching[J]. Acta Optica Sinica, 2007, 27(7): 217-1223
Authors:Huang Jing  Zhu Rihong  Chen Lei
Affiliation:School of Electronic Engineering and Photoelectric Technology, Nanjing University of Science and Technology, Nanjing 210094
Abstract:Based on single interferogram analysis method using fast Fourier transform (FFT), an interferogram spreading method based on exemplar matching is proposed. By analyzing the confidence and isophote of interferogram, the priority that is assigned to each patch on the fill front are calculated. After the patch most similar to the patch on the fill front is found in the source region of the interferogram, the value of each pixel in the patch on the fill front is copied from its corresponding position in the most similar patch. This spreading algorithm takes full advantage of the fringe characteristics and the directions of isophotes to synthesize the structure and texture information of interferogram and achieves good spreading effect. The proposed spreading algorithm is combined with FFT, filtering and phase unwrapping together to from a single interferogram analysis method of high-accuracy. The differences between the wave surface peak-valley value obtained by the proposed single interferogram analysis method and Zygo interferometer is less than λ/100, and the difference between the wave surface root-mean-square value obtained by these two methods is less then λ/100.
Keywords:optical measurement  interferogram spreading  exemplar matching  fast Fourier transforms
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