稀土离子Ho+,Ce+,La+与H2碰撞的单电子俘获截面测量

在复旦大学加速器实验室的３０ｋｅＶ同位素分离器上，使用新近建立的一套用于单价离子与气体分子碰撞的单电子俘获截面测量装置，测量了５—３０ｋｅＶ Ho⁺,Ce⁺,La⁺与H₂碰撞的单电子俘获截面．实验发现中空型离子源的阳极电压的变化对于稀土离子的亚稳态比例有一定影响，同时造成了单电子俘获截面的很大变化，而阳极电压对Ａｒ⁺的影响很小．还对实验结果进行了分析关键词：

SINGLE ELECTRON CAPTURE CROSS SECTION MEASURE MENT OF Ho+, Ce+ AND La+ IMPACT ON H2

The single electron capture cross sections for 5-30keV Ho⁺, La⁺ and Ce⁺ impact on H₂ at a fixed anode voltage of an ion source and 10keV Ho⁺ impact on H₂ at different anode voltage have been measured by the “growth rate method”. We found that the variation of the hollow cathode ion source’s anode voltage affected the proportion of the metastable states of the rare earth ions, and the proportion accounts for the significant change of single capture cross sections.