Force measurements on hydrophobized silica surfaces by using AFM |
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| Authors: | G. Hüttl K. Heger V. Klemm J. Theissig W. Wagner E. Müller |
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| Affiliation: | (1) TU Bergakademie Freiberg, Institut für Keramische Werkstoffe, Gustav-Zeuner-Strasse 3, D-09596 Freiberg, Germany e-mail: huettl@anw.ikw.tu-freiberg.de, DE;(2) TU Chemnitz, Institut für Chemie, Lehrstuhl für Physikalische Chemie, D-09107 Chemnitz, Germany, DE |
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| Abstract: | Force measurements between SiO2 surfaces with and without adsorbed phenyl groups in aqueous media using the atomic force microscope (AFM) are compared. An oxidized silicon tip and an oxidized silicon wafer were hydrophobized with phenyl groups, and the long-range attraction induced by hydrophobation is shown in force vs. distance curves. The observed differences prove that the silanol groups of the unmodified SiO2 surface are replaced by the phenyl groups. Received: 4 May 1998 / Revised: 1 July 1998 / Accepted: 5 July 1998 |
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