Effect of transverse stress on switch-toughening of ferroelectrics |
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| Authors: | Y Q Cui W Yang |
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| Institution: | Department of Engineering Mechanics, Tsinghua University, Beijing 100084, China |
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| Abstract: | Testing data indicated that T stress significantly altersR-curves of ferroelectrics. The model of stress-induced polarization switching is adopted to evaluate the fracture toughness of ferroelectrics under K field and T stress. Analytical solution is obtained to estimate the steady state fracture resistance of mono-domain ferroelectrics. The result is generalized to multi-domain ferroelectric ceramics via Reuss approximation, which enables us to explain quantitatively R-curves under two testing configurations. |
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| Keywords: | Ferroelectrics Switch-toughening T stress R-curve |
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