Viscoelastic property mapping with contact resonance force microscopy |
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Authors: | Killgore J P Yablon D G Tsou A H Gannepalli A Yuya P A Turner J A Proksch R Hurley D C |
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Institution: | National Institute of Standards and Technology, Boulder, Colorado 80305, USA. |
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Abstract: | We demonstrate the accurate nanoscale mapping of near-surface loss and storage moduli on a polystyrene-polypropylene blend with contact resonance force microscopy (CR-FM). These viscoelastic properties are extracted from spatially resolved maps of the contact resonance frequency and quality factor of the AFM cantilever. We consider two methods of data acquisition: (i) discrete stepping between mapping points and (ii) continuous scanning. For point mapping and low-speed scanning, the values of the relative loss and storage modulus are in good agreement with the time-temperature superposition of low-frequency dynamic mechanical analysis measurements to the high frequencies probed by CR-FM. |
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