Complementary application of neutron and synchrotron X-ray scattering to the determination of the magnetic microstructure of exchange-coupled layered nanoheterostructures |
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| Authors: | E A Kravtsov and V V Ustinov |
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| Institution: | 1.Institute of Metal Physics, Ural Branch,Russian Academy of Sciences,Yekaterinburg,Russia;2.Yeltsin Ural Federal University (Ural State Technical University—UPI),Yekaterinburg,Russia |
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| Abstract: | Complementary neutron and synchrotron X-ray scattering techniques have been considered as applied to the investigation of
an inhomogeneous magnetic microstructure typical of exchange-coupled nanoheterostructures consisting of alternating ferromagnetic
and antiferromagnetic metal layers. It has been demonstrated that changes in magnetic moments in both the magnitude and the
direction within ferromagnetic layers can be determined by combining polarized neutron and resonant X-ray magnetic reflectometry,
and those within antiferromagnetic layers, by combining X-ray and neutron diffractometry. |
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