EFTEM and EELS Analysis of a Pt/NiO Interface |
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Authors: | Werner Grogger Ferdinand Hofer Bernd Kraus Irmgard Rom Werner Sitte Peter Warbichler |
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Institution: | Research Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, A-8010 Graz, Austria, AT Gatan GmbH, Ingolst?dter Stra?e 40, D-80807 Munich, Germany, presently at Faculté des Sciences Exactes et Naturelles, GTSI, Departement de Physique, Campus Fouillole, 97159 Pointe à Pitre Cédex, Guadeloupe, DE Institute for Physical and Theoretical Chemistry, Graz University of Technology, Rechbauerstra?e 12, A-8010 Graz, Austria, AT
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Abstract: | Energy-filtering transmission electron microscopy (EFTEM) is more and more becoming an important nanoanalytical technique
in both materials science and biology. The main advantage of the method lies in the possibility to obtain two-dimensional
chemical information from large specimen areas as well as from features on a nanometer scale. Due to its excellent lateral
resolution it is perfectly suited for the investigation of nanometer sized features (e.g. interfaces).
In this paper we will show how EFTEM can be used to characterize the interface between a Pt layer and a NiO crystal as part
of a coulometric titration cell. In addition to elemental distribution maps electron energy-loss spectra (EELS) across the
interface (EELS linescans) have been acquired to obtain quantitative compositional profiles. By employing these methods the
following interfacial layers could be identified, all of which containing Pt, Ni and O in different proportions: 13 nm Pt-rich,
32 nm Ni-rich and 29 nm Pt-rich. The origin of these is discussed in terms of displacement reactions. |
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Keywords: | : Analytical electron microscopy energy-filtering TEM EELS Pt/NiO interface |
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