Scanning a metallic tip close to a quantum point contact |
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Authors: | A. Pioda D. Brunner S. Kicin T. Ihn M. Sigrist A. Fuhrer K. Ensslin M. Reinwald W. Wegscheider |
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Affiliation: | aSolid State Physics, ETH Zürich, 8093 Zürich, Switzerland;bInstitut für experimentelle und angewandte Physik, Universität Regensburg, Germany |
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Abstract: | Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance resonances appear to be related to the local potential within the channel of the point contact. As a consequence, the point contact with its conductance resonances can be used as a sensor for the local tip-induced potential. |
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Keywords: | Scanning probe microscopy Scanning-gate microscopy Quantum point contact |
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