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Scanning a metallic tip close to a quantum point contact
Authors:A. Pioda   D. Brunner   S. Kicin   T. Ihn   M. Sigrist   A. Fuhrer   K. Ensslin   M. Reinwald  W. Wegscheider
Affiliation:aSolid State Physics, ETH Zürich, 8093 Zürich, Switzerland;bInstitut für experimentelle und angewandte Physik, Universität Regensburg, Germany
Abstract:Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance resonances appear to be related to the local potential within the channel of the point contact. As a consequence, the point contact with its conductance resonances can be used as a sensor for the local tip-induced potential.
Keywords:Scanning probe microscopy   Scanning-gate microscopy   Quantum point contact
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