| 暗视场及相衬显微术及其对Nd:YAG晶体中缺陷研究 |
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| 引用本文： | 邓佩珍,乔景文,胡兵. 暗视场及相衬显微术及其对Nd:YAG晶体中缺陷研究[J]. 光学学报, 1988, 0(7) |
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| 作者姓名： | 邓佩珍 乔景文 胡兵 |
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| 作者单位： | 中国科学院上海光学精密机械研究所(邓佩珍，乔景文)，中国科学院上海光学精密机械研究所(胡兵) |
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| 摘 要： | 暗视场及相衬显微术的分辨率可达10～500(?),采用这两种技术可以十分清淅地观察到用引上法及温梯法生长的Nd:YAG晶体中的点缺陷集团,小尺寸位错环,蜷线位错,片状缺陷时精细结构.特别是观察到非缀饰刃位错及混台位错的图像.对非缀饰位错的观察已用化学腐浊,光双折射貌相术及X射线形貌术作了证明.
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| 关 键 词： | 相衬显微术 暗视场 缺陷 |
Study on defects in Nd: YAG crystals by darkfield and phase contrast microscopy |
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| DENG PEIZHEN,QIAO JINGWEN AND HU BING. Study on defects in Nd: YAG crystals by darkfield and phase contrast microscopy[J]. Acta Optica Sinica, 1988, 0(7) |
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| Authors: | DENG PEIZHEN QIAO JINGWEN AND HU BING |
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| Abstract: | The resolution of Darkfield and Phase Contrast Microscopy is up to 10-500A. The fine structure of point defect clusters, small size dislocation loops and helical dislocations in Nd:YAG crystals can been observed very clearly by these techniques, especialy, the image of the undecorated edge dislocations and mixed dislocations in crystals have also been got from them. The observation of undecorated dislocations was confarmed by chemical etching. optical birefringence and X-ray topography. |
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| Keywords: | phase contrast microscopy darkfield defects. |
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