Determination of surface flatness by spectral interferometric method |
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Authors: | HC Kandpal Ranjana Mehrotra Swati Raman |
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Institution: | Optical Radiation Standard, National Physical Laboratory, Dr. K.S. Krishnan Road, New Delhi -110012, India |
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Abstract: | In this study a novel method for determining surface flatness based on spectral interferometry is reported. In the traditional method a laser is used to produce intensity interference fringes and by measuring the shift in the position of a fringe when a test plate is put on a reference plate, the surface flatness of the test plate is determined. In the present study we have used a broad-band source for determining the flatness of a test plate. By studying the changes in the spectrum of the source on interference that are produced when a test plate is put on a reference plate, the surface flatness is determined. It has been found that the surface flatness determined by spectral studies comes out to be of the same order as that with a quasi-monochromatic laser light. This method might provide an edge over the present method by reducing the time taken in the study and also provide a cost-effective solution. |
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Keywords: | Spectral interferometry Surface flatness Fizeau-interferometer Broad-band source |
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